SEM Annual 2020
Virtual XIV International Congress
Annual Conference and Exposition on Experimental and Applied Mechanics
September 14–17, 2020
SEM’s Annual Conference and Exposition focuses on all areas of research and applications pertaining to experimental mechanics, and has evolved to encompass the latest technologies supporting optical methods; additive & advanced manufacturing; dynamic behavior of materials; biological systems; micro-and nano mechanics; fatigue and fracture; composite and multifunctional materials; residual stress; inverse problem methodologies; thermomechanics; and time dependent materials.
This broad focus on experimental mechanics includes topics in digital image and digital volume correlation techniques, speed impacts to shock and blast, durability and extreme environmental effects, model/experiment integration, materials for advanced manufacturing, damage detection and non destructive testing, tools spanning various length scales and new experimental techniques and methods to address real-life applications, research and collaborative efforts across all disciplines complementing experimental mechanics.
The SEM XIV International Congress will be held in a virtual format. This format may include live and on-demand lectures and/or presentations, synchronous and asynchronous question and answer sessions facilitated by SEM, discussion and interaction through our app platform and other details that are currently being finalized. As with our typical conference, all authors/presenters will have access to each others submissions.
Virtual attendees will have access to recorded presentations preceeding the conference dates and Q&A periods will be held during the week of September 14–17, 2020. The prestigious Murray Lecture, the Springer/Nature Publishing Young Investigator Lecture and session keynote lectures will also be available.
If you decide not to participate, we hope that you will consider submitting your work to the SEM Annual Conference 2021 in Albuquerque, New Mexico. We welcome extensions of the same work submitted to Annual 2020.
Learn more about 3D-DIC solutions & high-speed imaging:
Contact a Hadland Imaging representative to learn more and visit our page on DIC Solutions (digital image correlation) for more information about testing machines, high-speed cameras & everything you need to get the job done right.
Keywords: SEM, Annual 2020, Virtual XIV International Conference, Shimadzu Hyper Vision HPV-X2, 2D/3D DIC